ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,101, issued on Nov. 3. "System and method for measuring fish" was invented by Joshua Garner (Grand Rapids, Minn.). According to the abstrac... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,102, issued on Nov. 3, was assigned to Dust Co. Inc. (Raleigh, N.C.). "Settled dust measurement device using capacitance" was invented by Ro... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,103, issued on Nov. 3, was assigned to Infineon Technologies AG (Neubiberg, Germany). "Apparatus and method for measuring a magnetic angle" ... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,104, issued on Nov. 3, was assigned to FORWARD ELECTRONICS Co. LTD. (Taipei City, Taiwan). "Encoder with light emitting diode" was invented ... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,105, issued on Nov. 3, was assigned to Festo SE & Co. KG (Esslingen, Germany). "Method and device for determining a piston or wheel position... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,106, issued on Nov. 3, was assigned to SEIKO EPSON Corp. (Japan). "Laser interferometer" was invented by Jun Kitagawa (Matsumoto, Japan) and... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,107, issued on Nov. 3, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Semiconductor measurement device" was invented... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,108, issued on Nov. 3, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Semiconductor measurement apparatus" was inven... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,109, issued on Nov. 3, was assigned to Munro Design & Technologies LLC (Ontario, N.Y.). "Reflective co-axial interferometer systems and meth... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,110, issued on Nov. 3, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Semiconductor measuring device using beam disp... Read More